VIP Central

Archive for the 'Test Suites' Category

 

Latest Buzz on Next Generation Protocols

We recently published the VIP Newsletter for Jan 2018, containing trending topics, leading solutions, in depth technical articles, videos, webinars, and updates on next generation protocols. In case you missed the latest buzz on Verification IP, you can read it here.                     The Q1 2018 edition […]

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Posted in ACE, AMBA, Automotive, AXI, C-PHY, Camera, CHI, CSI, D-PHY, Data Center, DDR, Debug, Flash, Interconnects, LPDDR, Memory, Methodology, MIPI, Mobile SoC, NVMe, PCIe, Processor Subsystems, SPI, Storage, SystemVerilog, Test Suites, Type C, Uncategorized, UVM | Comments Off on Latest Buzz on Next Generation Protocols

 

Industry’s First Source Code Test Suite and Verification IP for Arm AMBA ACE5 and AXI5 Enables Early Adopter Success

Synopsys offers a broad set of verification solutions for next generation Arm® AMBA® protocols, including AMBA CHI Issue B, and verification automation solutions including Auto SoC Testbench Generation and AutoPerformance for AMBA protocols, which designers have widely adopted and achieved numerous tape-out successes. We continue the rapid expansion of Synopsys’ verification solutions for AMBA protocols […]

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Posted in ACE, AMBA, AXI, CHI, Interconnects, Test Suites | Comments Off on Industry’s First Source Code Test Suite and Verification IP for Arm AMBA ACE5 and AXI5 Enables Early Adopter Success

 

Verification Automation Solutions for Arm AMBA Coherent Interconnects

Arm TechCon 2017 took place at Santa Clara on 24-26th Oct, 2017. This year, Synopsys’ Arm® AMBA® protocol experts were on hand to demonstrate our verification automation solutions for Arm AMBA Coherent Interconnects. Synopsys Auto SoC Testbench generation solution enables easy and quick integration and configuration of hundreds of coherent and non-coherent AMBA ports and […]

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Posted in ACE, AMBA, Automotive, CCI400, CHI, Data Center, Interconnects, Methodology, Mobile SoC, NOC, Processor Subsystems, SystemVerilog, Test Suites, UVM | Comments Off on Verification Automation Solutions for Arm AMBA Coherent Interconnects

 

Jumping the Barrier of Verifying Arm AMBA ACE Protocol Barrier Transactions

The ordering of memory transactions in Arm® AMBA® protocol is a significant requirement, i.e. the sequence of memory updates/accesses must follow a defined ordering as per the specification. Ordering is important for synchronization events by a processor with respect to retiring load/store instructions. AMBA ACE barrier transactions are used for maintaining the memory ordering across […]

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Posted in ACE, AMBA, CCI400, CHI, Interconnects, Test Suites, Uncategorized | Comments Off on Jumping the Barrier of Verifying Arm AMBA ACE Protocol Barrier Transactions

 

MIPI DevCon 2016: SoundWire VIP

MIPI DevCon 2016 was successfully held at Mountain View, California on 14-15th Sep, 2016. Synopsys MIPI protocol experts were there demonstrating our MIPI design and verification solutions for wide spectrum of markets ranging from IoT, to mobile, automotive, and consumer. During the conference Synopsys had several presentations.  One of the papers presented by Synopsys was […]

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Posted in Audio, Automotive, C-PHY, Camera, CSI, D-PHY, events, I2S, I3C, Interface Subsystems, MIPI, Mobile SoC, MPHY, SlimBus, Soundwire, Test Suites, UFS, Unipro | Comments Off on MIPI DevCon 2016: SoundWire VIP

 

AMBA AXI Exclusive Access De-mystified

AMBA AXI exclusive access may look simple at first glance, but as we delve deeper into it, we find the different flavors of exclusive access. The possibility of these different scenarios and combinations poses a tough challenge in verifying the critical feature in AMBA-based designs. This blog primarily focusses on exclusive access in AMBA AXI3, […]

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Posted in AMBA, CCI400, Interconnects, NOC, Test Suites, Uncategorized | Comments Off on AMBA AXI Exclusive Access De-mystified

 

PCIe Gen4 Test Suite with Spec Linking Demo

During the recent PCI-SIG Developers Conference 2016, held in Santa Clara, CA, there was a lot of interest from attendees regarding Synopsys PCIe Gen4 VIP and source code test suite.  One common question that was asked: How do we identify and maintain up to date tests that support the latest PCIe Gen4 specification? Demonstration: The […]

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Posted in Data Center, NVMe, PCIe, Processor Subsystems, Test Suites, Uncategorized | Comments Off on PCIe Gen4 Test Suite with Spec Linking Demo

 

Verification Highlights from DAC 2016

The Design Automation Conference (DAC) 2016 was a great success and here we provide you the highlights of Synopsys’ activities at the event. Synopsys hosted the annual “SoC Leaders Verify with Synopsys” Verification luncheon.  The luncheon featured industry experts and executives from Cavium, NXP, Qualcomm and Samsung, and drove our main messages of collaboration, with […]

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Posted in AMBA, Audio, Automotive, Camera, CAN, Data Center, DDR, Debug, DesignWare, Display, eMMC, Ethernet, Ethernet AVB, Flash, FlexRay, HBM, HMC, Interconnects, Interface Subsystems, LIN, LPDDR, Memory, Methodology, MIPI, Mobile SoC, ONFi, PCIe, Processor Subsystems, Storage, SystemVerilog, Test Suites, UFS, Uncategorized, USB, UVM | Comments Off on Verification Highlights from DAC 2016

 

Synopsys Verification Continuum at DAC 2016

The Design Automation Conference (DAC) 2016, in Austin, Texas kicks off next week starting June 5th to June 9th. As the leading and longest-running annual design and verification event, DAC is the premier place to network with fellow design and verification engineers. Synopsys will feature its annual Verification Luncheon and Customer Panel that discusses the […]

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Posted in Audio, Automotive, Camera, Data Center, Debug, DesignWare, Display, Ethernet, Interface Subsystems, Methodology, Mobile SoC, PCIe, Processor Subsystems, Storage, Success Stories, SystemVerilog, Test Suites, Uncategorized, UVM | Comments Off on Synopsys Verification Continuum at DAC 2016

 

Integrate USB Test Suite Quickly to Jump Start Verification

SoC being designed today are getting complex day by day and verification complexity increases exponentially not only due to the complexity of design but also due to the complexity of protocols. Emerging new protocols make it further difficult due to steep learning curve. Writing test cases to cover the entire protocol becomes 3-4 man year […]

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Posted in Test Suites, USB | Comments Off on Integrate USB Test Suite Quickly to Jump Start Verification