Products + All Products + Software Integrity + Semiconductor IP + Verification + Design + Silicon Engineering
Posted by Karen B on 05/06/2008
For the first time in 20 years, I’m not going to DAC. Really.
Instead, I will be in New Jersey, participating in IEEE Standards Association meetings which just happened to coincide with this year’s DAC.
Here are a few of the things I will miss at DAC:
Hanging out with my fellow bloggers in the Synopsys booth as they meet and greet their readers.
Working in the Synopsys standards booth #1541 which features VMM, IPL, and UPF.
WORKSHOP: Design and Verification of Low Power SoCs: An Application Oriented Approach
WORKSHOP: Women in Design Automation: Networking, Negotiation, and Nonsense: Achieving Career Balance in an Unbalanced World
WORKSHOP: Introduction to Chips and EDA for a Non-technical Audience (to be taught by the dynamic Pamela McDaniel in my place)
LUNCH: Interoperable PDK Libraries: “The proof is in the pudding!”
PAVILION PANEL: Student design contest
RECEPTION: Synopsys/Sun university event
BREAKFAST: AMS Verification and Moore’s Law… solutions for 45nm and beyond.
WORKSHOP: Effective Technical Writing
LUNCH: VMM User Forum: Methodology Beyond Base Classes
FORUM: Accellera Technical Committee Update and Technical Excellence Award
Playing Paula Abdul at the Denial (sic) Party.
BREAKFAST: Raiders of the Locked Art: Opening the Treasure with Interoperable PDK
BREAKFAST: Accellera’s “Save Money Now! How to Reduce Costs, Complexity and Time to Market”
LUNCH: Eclypse low power solution: First to Market with Differentiated Green-by-Design Electronic Consumer Products
Connecting with industry bloggers at the blogger Birds-of-a-Feather session.
PAVILION PANEL: Negotiating a Successful Career
TUTORIAL: Low power techniques for SoC design
I’ll miss a lot of interesting events, good technical sessions, keynote speeches, and calories. But most of all, I will miss seeing all of my colleagues and friends.
Have a wonderful DAC, everyone!
EDA standards blog The Standards Game
DAC Design Automation Conference
VMM Verification Methodology Manual open verification methodology
UPF Unified Power Format low power design
IPL Interoperable PDK Library pcells
Women in Design Automation