Looking Past the Horizon

Archive for the 'Test Automation' Category

 

It’s All About Staying Ahead of the Test Challenges Curve

As test pattern compression falls behind, new techniques are needed to keep test times in check. Since the early days when semiconductor devices contained a mere handful of gates, the manufacturing test world has been focused on how to detect the greatest number of potential defects in the shortest amount of time. This fundamental goal has not changed over the years and continues at 5nm and beyond.

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Posted in EDA, Test Automation |