Posted by Hélène Thibiéroz on February 22, 2016
Hello again HSPICE users!
Webisode #8 in the HSPICE Tips & Tricks Webisode Series—MOS Reliability Analysis: Aging Simulation and Analysis of CMOS Circuits—continues the discussion begun in webisode #7. Sr. CAE Manju Vadiarillat explains the concept of CMOS circuit aging, and its simulation and analysis through HSPICE’s MOS Reliability Analysis (MOSRA). By watching this 15-minute webisode, you will also learn techniques to obtain and interpret circuit degradation results for your next aging-aware design.
To help you become more familiar with the benefits of MOSRA, the complete demo case is available for free—watch the webisode to request your own copy and try it out!
We continue to add to the HSPICE Tips & Tricks Webisode Series, a collection of mini webinars to help make your simulation tasks easier and more productive. Topics that have been covered to-date include: S-element, eye diagrams, IBIS-AMI, RUNLVL, Monte Carlo analysis, and MOSRA.
Look for the next webisode on “Linear Amplifier Analysis—Predicting Gain and Noise Performance” with Scott Wedge to premiere in March.