Is Your MOSFET Suffering the Effects of Aging?

Hello everyone,

We have more new tidbits for our Synopsys HSPICE users!

Due to popular demand, we posted a new HSPICE Tips & Tricks webisode – #7 in the series – on MOS Reliability and Analysis (MOSRA) Level 3. In this 15-minute webisode, Synopsys Sr. R&D Manager Joddy Wang explains the formulation of HSPICE’s built-in MOSRA Level 3 model that accurately captures two major aging effects in MOSFETs: the Hot Carrier Injection (HCI) effect and the Bias Temperature Instability (BTI) effect. In this webisode, you will learn what measurement data is needed to extract and validate a MOSRA Level 3 model.

To help you become familiar with MOSRA, the complete demo case used in this webisode is available for free – watch the webisode to request your own copy and try it out!

We continue to add to the HSPICE Tips & Tricks Webisode Series, a collection of mini webinars to help make your simulation tasks easier and more productive. Topics that have been covered so far include: S-element, eye diagrams, IBIS-AMI, RUNLVL, and Monte Carlo analysis. Look for the next webisode on MOSRA Aging Simulation and Analysis of CMOS Circuits to premiere in February.

Is there a topic you’d like us to address in an upcoming webisode? Feel free to let us know by adding a comment on the web page.

Hope the beginning of 2016 has been very good for all of you!